Shenzhen GBIT Testing Technology Co., Ltd
Phone: 0755-83698930
Email: dongni.zhang@gbit.net.cn
Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen
全功能可靠性测试系统
* The same model of product may have multiple versions, and there may be differences between different versions of the product (including functional parameters, logo design, appearance details, product information, etc.). Please refer to the actual product for accuracy
STAR全功能测试系统满足行业的可靠性测试需求，包括热载子注入(HCI)、偏压温度不稳定性(BTI)、OTF、时间相依介电质崩溃(TDDB)、电子迁移(EM )、应力诱导漏电流（SILC）等等。
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系统组成：
 | Gemini 全功能可靠性测试系统 是HCI、BTI、TDDB、SILC、电子迁移和应力迁移等全功能可靠性测试系统。
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 | Pluto All-in-one Per-Pin SMU 可靠性测试系统是一款高端全功能测试系统，适用在封装级与晶圆级测试，且涵盖HCI，BTI，OTF，TDDB 和 EM 等所有可靠性要求。 产品功能： 是次世代的可靠性测试系统，可提高工程和生产需求的测量精度和效率。 特点和规格：
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Shenzhen GBIT Testing Technology Co., Ltd
Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen
Mailbox：dongni.zhang@gbit.net.cn
Tel：0755-83698930
