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Shenzhen GBIT Testing Technology Co., Ltd

Phone: 0755-83698930

Email: dongni.zhang@gbit.net.cn

Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen

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异构芯片RDL层双面全自动测试的应用
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芯片植球后全自动射频测试应用
描述：为了应对半导体芯片高密度、高性能与小体积、小尺寸之间日益严峻的挑战，3D芯片封装技术应运而生。其中晶圆级微球植球后的射频测试越发重要，传统的悬臂探针、垂直探针、MEMS探针等技术对微球顶部均有不
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Shenzhen GBIT Testing Technology Co., Ltd

Address: Room 1203, Block C, World Trade Plaza, No. 9 Fuhong Road, Futian District, Shenzhen

Mailbox：dongni.zhang@gbit.net.cn

Tel：0755-83698930

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