Technical Characteristics
Semiconductor Wafer-Level Automated On-wafer test system software
Semiconductor wafer-level automatic
On-chip test system software
Semiconductor Test Systems Integrated Totally Solutions
Semiconductor test systems
integrated one key solution
Microwave RF Device Measurement System Integration Solutions
Microwave RF device measurements
System integration solutions
Products
后台自定添加
- Probe Station Series
- Microwave RF measurement equipment
- Chip ESD equipment
- Packaging and testing equipment
- Single-chip test equipment
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
Microwave RF measurement equipment
Microwave RF test equipment
Available from the smallest adapter to the largest test system
Calibration, measurement, and modeling solutions are integrated seamlessly
Chip ESD equipment
Chip ESD test equipment
Semiconductor electrostatic test (ESD) visualization equipment
Wafer ESD test/TLP test/CDM test/electrostatic damage detection device
Meet the needs of fully automated ESD testing of wafer-level or packaged ICs
Packaging and testing equipment
Packaging and testing equipment
Semiconductor packaging and testing equipment
Domestic supply is independent and controllable
Single-chip test equipment
Single-chip test equipment
Single-chip fully automated test system
Supports multiple precursors including (blue film, film box, waffle box, custom vehicle)
About
Professional team with advanced concepts
Integration and data sharing of semiconductor wafer on chip testing and device sealing testing in a one-stop system
高端设备
供应世界一流品牌高精度设备
系统集成
广泛应用于半导体晶圆领域
技术服务
拥有12年的系统整合专业技术
定制服务
提供客户所需定制服务