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- Probe Station Series
- Probe Station Series
- Probe Station Series
- Probe Station Series
- Probe Station Series
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
Probe Station Series
Manual/semi-automatic/fully automatic/high-power/RF/high and low temperature probe stations fully meet the testing needs of power semiconductors, RF front-end chips, wafer DC, silicon optics, and other related devices
About
Professional team with advanced concepts
Integration and data sharing of semiconductor wafer on chip testing and device sealing testing in a one-stop system
高端设备
供应世界一流品牌高精度设备
系统集成
广泛应用于半导体晶圆领域
技术服务
拥有12年的系统整合专业技术
定制服务
提供客户所需定制服务
Cooperative Partner
Years of companionship and moving forward side by side











